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Beilstein J. Nanotechnol. 2023, 14, 1085–1092, doi:10.3762/bjnano.14.89
Figure 1: Dependence of SnO2 film GPC on the evaporation temperature of the SnI4 precursor. The cycle times w...
Figure 2: Time evolution of the QCM mass sensor signal during five sequential ALD cycles (a), and during one ...
Figure 3: QCM frequency decrement measured per single ALD cycle as function of the SnI4 pulse length. The len...
Figure 4: SnO2 film GPC as function of the number of ALD cycles.
Figure 5: SnO2 GPC as function of the substrate temperature.
Figure 6: Oxygen content in the SnO2 films as function of the substrate temperature.
Figure 7: Content of residual iodine in tin oxide films deposited from tin iodide and ozone in the temperatur...
Figure 8: GIXRD patterns of SnO2 films deposited at the given temperatures. Miller indices attributed to the ...
Figure 9: Refractive index of a SnO2 film deposited at 300 °C to a thickness of 110 nm as function of the wav...
Figure 10: XPS results of (a) Sn 3d, (b) O 1s, and (c) valence-band region of the SnO2 films deposited at 300 ...
Figure 11: XAS results depicting O 1s (a) and Sn 3d (b) spectra of the SnO2 films deposited at 300 and 500 °C.